de Groot, Frank M. F.; de Smit, Emiel; van Schooneveld, Matti M.; Aramburo, Luis R.; Weckhuysen, Bert M.

ChemPhysChem (2010), 11(5), 951-962 CODEN: CPCHFT; ISSN: 1439-4235. English.

A review. The present status of in-situ scanning transmission X-ray microscopy (STXM) is reviewed, with an emphasis on the abilities of the STXM technique in comparison with electron microscopy. The exptl. aspects and interpretation of X-ray absorption spectroscopy (XAS) are briefly introduced and the exptl. boundary conditions that determine the potential applications for in-situ XAS and in-situ STXM studies are discussed. Nanoscale chem. imaging of catalysts under working conditions is outlined using cobalt and iron Fischer-Tropsch catalysts as showcases. In the discussion, we critically compare STXM-XAS and STEM-EELS (scanning transmission electron microscopy-electron energy loss spectroscopy) measurements and indicate some future directions of in-situ nanoscale imaging of catalytic solids and related nanomaterials.